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Journal: Electronics, 2020
Volume: 9
Number: 626
Article:
Error-Vulnerable Pattern-Aware Binary-to-Ternary Data Mapping for Improving Storage Density of 3LC Phase Change Memory
Authors:
by
Jeong Beom Hong, Young Sik Lee, Yong Wook Kim and Tae Hee Han
Link:
https://www.mdpi.com/2079-9292/9/4/626
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