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Journal: Electronics, 2020
Volume: 9
Number: 626

Article: Error-Vulnerable Pattern-Aware Binary-to-Ternary Data Mapping for Improving Storage Density of 3LC Phase Change Memory
Authors: by Jeong Beom Hong, Young Sik Lee, Yong Wook Kim and Tae Hee Han
Link: https://www.mdpi.com/2079-9292/9/4/626

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