Peral, J.; Gil, D.; Rotbei, S.; Amador, S.; Guerrero, M.; Moradi, H.
A Machine Learning and Integration Based Architecture for Cognitive Disorder Detection Used for Early Autism Screening. Electronics 2020, 9, 516.
https://doi.org/10.3390/electronics9030516
AMA Style
Peral J, Gil D, Rotbei S, Amador S, Guerrero M, Moradi H.
A Machine Learning and Integration Based Architecture for Cognitive Disorder Detection Used for Early Autism Screening. Electronics. 2020; 9(3):516.
https://doi.org/10.3390/electronics9030516
Chicago/Turabian Style
Peral, Jesús, David Gil, Sayna Rotbei, Sandra Amador, Marga Guerrero, and Hadi Moradi.
2020. "A Machine Learning and Integration Based Architecture for Cognitive Disorder Detection Used for Early Autism Screening" Electronics 9, no. 3: 516.
https://doi.org/10.3390/electronics9030516
APA Style
Peral, J., Gil, D., Rotbei, S., Amador, S., Guerrero, M., & Moradi, H.
(2020). A Machine Learning and Integration Based Architecture for Cognitive Disorder Detection Used for Early Autism Screening. Electronics, 9(3), 516.
https://doi.org/10.3390/electronics9030516