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Journal: Electronics, 2020
Volume: 9
Number: 2164

Article: Influence of Structural Defects on the Resistivity and Current Flow Field in Conductive Thin Layers
Authors: by Stanisław Pawłowski, Jolanta Plewako and Ewa Korzeniewska
Link: https://www.mdpi.com/2079-9292/9/12/2164

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