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Journal: Electronics, 2020
Volume: 9
Number: 2124
Article:
A Comparative Analysis between Standard and mm-Wave Optimized BEOL in a Nanoscale CMOS Technology
Authors:
by
Egidio Ragonese, Claudio Nocera, Andrea Cavarra, Giuseppe Papotto, Simone Spataro and Giuseppe Palmisano
Link:
https://www.mdpi.com/2079-9292/9/12/2124
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