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Journal: Electronics, 2020
Volume: 9
Number: 2124

Article: A Comparative Analysis between Standard and mm-Wave Optimized BEOL in a Nanoscale CMOS Technology
Authors: by Egidio Ragonese, Claudio Nocera, Andrea Cavarra, Giuseppe Papotto, Simone Spataro and Giuseppe Palmisano
Link: https://www.mdpi.com/2079-9292/9/12/2124

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