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Journal: Electronics, 2020
Volume: 9
Number: 27

Article: Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty
Authors: by Jingtian Liu, Qian Sun, Bin Liang, Jianjun Chen, Yaqing Chi and Yang Guo
Link: https://www.mdpi.com/2079-9292/9/1/27

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