Liu, J.; Sun, Q.; Liang, B.; Chen, J.; Chi, Y.; Guo, Y.
Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty. Electronics 2020, 9, 27.
https://doi.org/10.3390/electronics9010027
AMA Style
Liu J, Sun Q, Liang B, Chen J, Chi Y, Guo Y.
Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty. Electronics. 2020; 9(1):27.
https://doi.org/10.3390/electronics9010027
Chicago/Turabian Style
Liu, Jingtian, Qian Sun, Bin Liang, Jianjun Chen, Yaqing Chi, and Yang Guo.
2020. "Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty" Electronics 9, no. 1: 27.
https://doi.org/10.3390/electronics9010027
APA Style
Liu, J., Sun, Q., Liang, B., Chen, J., Chi, Y., & Guo, Y.
(2020). Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty. Electronics, 9(1), 27.
https://doi.org/10.3390/electronics9010027