Next Article in Journal
Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics
Next Article in Special Issue
Enabling Non-Linear Energy Harvesting in Power Domain Based Multiple Access in Relaying Networks: Outage and Ergodic Capacity Performance Analysis
Previous Article in Journal
A Multi-Inductor H Bridge Fault Current Limiter
Previous Article in Special Issue
A Survey on RF and Microwave Doherty Power Amplifier for Mobile Handset Applications
 
 
Due to scheduled maintenance work on our servers, there may be short service disruptions on this website between 11:00 and 12:00 CEST on March 28th.
Article

Article Versions Notes

Electronics 2019, 8(7), 796; https://doi.org/10.3390/electronics8070796
Action Date Notes Link
article html file updated 30 August 2025 22:34 CEST Update https://www.mdpi.com/2079-9292/8/7/796/html
article html file updated 21 August 2025 21:43 CEST Update -
article html file updated 20 July 2022 06:54 CEST Update -
article html file updated 13 February 2020 02:46 CET Update -
article html file updated 31 July 2019 18:06 CEST Update -
article html file updated 16 July 2019 14:05 CEST Original file -
article pdf uploaded. 16 July 2019 14:03 CEST Version of Record https://www.mdpi.com/2079-9292/8/7/796/pdf
article xml uploaded. 16 July 2019 14:03 CEST Update https://www.mdpi.com/2079-9292/8/7/796/xml
article xml file uploaded 16 July 2019 14:03 CEST Original file -
Back to TopTop