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Journal: Electronics, 2019
Volume: 8
Number: 323
323
Article: Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs
Authors: by Chang Cai, Xue Fan, Jie Liu, Dongqing Li, Tianqi Liu, Lingyun Ke, Peixiong Zhao and Ze He
Link: https://www.mdpi.com/2079-9292/8/3/323

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