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Journal: Electronics, 2019
Volume: 8
Number: 1469

Article: Electrostatic-Discharge-Immunity Impacts in 300 V nLDMOS by Comprehensive Drift-Region Engineering
Authors: by Po-Lin Lin, Shen-Li Chen and Sheng-Kai Fan
Link: https://www.mdpi.com/2079-9292/8/12/1469

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