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Journal: Electronics, 2018
Volume: 7
Number: 16
Article:
Fault Diagnosis Using Improved Complete Ensemble Empirical Mode Decomposition with Adaptive Noise and Power-Based Intrinsic Mode Function Selection Algorithm
Authors:
by
Hyungseob Han, Sangjin Cho, Sundeok Kwon and Sang-Bock Cho
Link:
https://www.mdpi.com/2079-9292/7/2/16
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