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Journal: Electronics, 2018
Volume: 7
Number: 406

Article: Performance and Life Degradation Characteristics Analysis of NCM LIB for BESS
Authors: by Soon-Jong Kwon, Sung-Eun Lee, Ji-Hun Lim, Jinhyeok Choi and Jonghoon Kim
Link: https://www.mdpi.com/2079-9292/7/12/406

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