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Open AccessArticle

Reliability of Variable Speed Pumped-Storage Plant

1
Power Electronics Laboratory, Department of Electrical and Computer Engineering, Ajou University; Suwon 443749, Korea
2
Hydropower Simulation Laboratory, Department of Water Resources Development and Management, Indian Institute of Technology Roorkee, Roorkee 247667, India
*
Author to whom correspondence should be addressed.
Electronics 2018, 7(10), 265; https://doi.org/10.3390/electronics7100265
Received: 20 September 2018 / Revised: 18 October 2018 / Accepted: 19 October 2018 / Published: 22 October 2018
(This article belongs to the Special Issue Renewable Electric Energy Systems)
The multi-channel (MC) back-to-back voltage source inverter (VSI)-fed doubly fed induction machine (DFIM) is emerging as a highly interesting topic in large-rated variable speed pumped-storage power plants (PSPP) in view of cost, optimal efficiency, and space requirements. Although the VSI is the fundamental part of the drive controlling the active/reactive power of the plant, redundancy is presently not adopted in practice causing the unit as a whole to shut down upon a failure in the converter and control circuit. This paper evaluates a large-rated (250 MW) DFIM-fed variable-speed unit of a PSPP in terms of its reliability and availability. A Markov model is developed to assess the reliability of the drive based on a number of factors including survivability and annual failure rate (FIT). Further, the Markov model is applied to different PSPPs for comparison of reliability among them. View Full-Text
Keywords: pumped-storage power plant; doubly fed induction machine; Markov model; reliability pumped-storage power plant; doubly fed induction machine; Markov model; reliability
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MDPI and ACS Style

Joseph, A.; Chelliah, T.R.; Lee, S.S.; Lee, K.-B. Reliability of Variable Speed Pumped-Storage Plant. Electronics 2018, 7, 265. https://doi.org/10.3390/electronics7100265

AMA Style

Joseph A, Chelliah TR, Lee SS, Lee K-B. Reliability of Variable Speed Pumped-Storage Plant. Electronics. 2018; 7(10):265. https://doi.org/10.3390/electronics7100265

Chicago/Turabian Style

Joseph, Anto; Chelliah, Thanga R.; Lee, Sze S.; Lee, Kyo-Beum. 2018. "Reliability of Variable Speed Pumped-Storage Plant" Electronics 7, no. 10: 265. https://doi.org/10.3390/electronics7100265

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