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Journal: Electronics, 2018
Volume: 7
Number: 224
Article:
Comprehensive Sensing Current Analysis and Its Guideline for the Worst-Case Scenario of RRAM Read Operation
Authors:
by
Zhensen Tang, Yao Wang, Yaqing Chi and Liang Fang
Link:
https://www.mdpi.com/2079-9292/7/10/224
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