From Quality Grading to Defect Recognition: A Dual-Pipeline Deep Learning Approach for Automated Mango Assessment
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Lin, S.; Chiu, H. From Quality Grading to Defect Recognition: A Dual-Pipeline Deep Learning Approach for Automated Mango Assessment. Electronics 2026, 15, 549. https://doi.org/10.3390/electronics15030549
Lin S, Chiu H. From Quality Grading to Defect Recognition: A Dual-Pipeline Deep Learning Approach for Automated Mango Assessment. Electronics. 2026; 15(3):549. https://doi.org/10.3390/electronics15030549
Chicago/Turabian StyleLin, Shinfeng, and Hongting Chiu. 2026. "From Quality Grading to Defect Recognition: A Dual-Pipeline Deep Learning Approach for Automated Mango Assessment" Electronics 15, no. 3: 549. https://doi.org/10.3390/electronics15030549
APA StyleLin, S., & Chiu, H. (2026). From Quality Grading to Defect Recognition: A Dual-Pipeline Deep Learning Approach for Automated Mango Assessment. Electronics, 15(3), 549. https://doi.org/10.3390/electronics15030549
