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Article

Curvature-Adaptive Smoothing for Multi-View Industrial Metrology

1
OceanlightAI Co., Ltd., Daegu 41260, Republic of Korea
2
School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea
*
Author to whom correspondence should be addressed.
Electronics 2026, 15(11), 2360; https://doi.org/10.3390/electronics15112360
Submission received: 30 March 2026 / Revised: 13 May 2026 / Accepted: 26 May 2026 / Published: 29 May 2026
(This article belongs to the Special Issue Artificial Intelligence, Computer Vision and 3D Display, 2nd Edition)

Abstract

Three-dimensional point cloud data acquired in industrial environments inherently exhibit quality limitations, including measurement noise, local geometric irregularities, and surface roughness. These issues are commonly observed in both structured-light scanning and SIFT-based photogrammetric reconstruction, highlighting the necessity of post-processing in metrology applications where dimensional accuracy and geometric reliability are critical. However, conventional global-parameter smoothing methods, such as Savitzky–Golay filtering, LOWESS, and bilateral filtering, apply uniform smoothing intensity across regions with varying curvature, resulting in an inherent trade-off between noise suppression and geometry preservation. In this study, we propose a learning-independent post-processing framework that adaptively modulates smoothing strength by integrating local curvature estimation with unsupervised anomaly modeling. The proposed approach combines normal-variance-based curvature approximation with k-nearest neighbor anomaly scoring, while CAD data are employed exclusively as an external reference for evaluation. Experimental results on industrial product datasets demonstrate that, for structured-light reconstructions, the proposed method reduces average error to a level comparable to local regression-based smoothing while simultaneously achieving the highest edge-preservation index among all evaluated methods, thereby attaining an optimal operating point between noise suppression and geometric integrity. Although the suppression of extreme deviations remains limited, the geometry-preservation metrics are improved without a significant increase in average error. In contrast, SIFT+COLMAP-based reconstructions exhibit performance comparable to that of the original data, a behavior attributable to low-frequency systematic reconstruction biases rather than high-frequency sensor noise, which fall outside the corrective capacity of purely geometry-driven local smoothing.
Keywords: 3D reconstruction; industrial metrology; structure from motion; point cloud registration; SIFT; FPFH; geometric post-processing 3D reconstruction; industrial metrology; structure from motion; point cloud registration; SIFT; FPFH; geometric post-processing
Graphical Abstract

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MDPI and ACS Style

Lee, J.K.; Kwon, S.W.; Park, H.G.; Baek, S.K.; Kim, M.Y. Curvature-Adaptive Smoothing for Multi-View Industrial Metrology. Electronics 2026, 15, 2360. https://doi.org/10.3390/electronics15112360

AMA Style

Lee JK, Kwon SW, Park HG, Baek SK, Kim MY. Curvature-Adaptive Smoothing for Multi-View Industrial Metrology. Electronics. 2026; 15(11):2360. https://doi.org/10.3390/electronics15112360

Chicago/Turabian Style

Lee, Jae Kyung, Soon Woo Kwon, Hae Gwang Park, Seung Ki Baek, and Min Young Kim. 2026. "Curvature-Adaptive Smoothing for Multi-View Industrial Metrology" Electronics 15, no. 11: 2360. https://doi.org/10.3390/electronics15112360

APA Style

Lee, J. K., Kwon, S. W., Park, H. G., Baek, S. K., & Kim, M. Y. (2026). Curvature-Adaptive Smoothing for Multi-View Industrial Metrology. Electronics, 15(11), 2360. https://doi.org/10.3390/electronics15112360

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