Curvature-Adaptive Smoothing for Multi-View Industrial Metrology
Abstract
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Lee, J.K.; Kwon, S.W.; Park, H.G.; Baek, S.K.; Kim, M.Y. Curvature-Adaptive Smoothing for Multi-View Industrial Metrology. Electronics 2026, 15, 2360. https://doi.org/10.3390/electronics15112360
Lee JK, Kwon SW, Park HG, Baek SK, Kim MY. Curvature-Adaptive Smoothing for Multi-View Industrial Metrology. Electronics. 2026; 15(11):2360. https://doi.org/10.3390/electronics15112360
Chicago/Turabian StyleLee, Jae Kyung, Soon Woo Kwon, Hae Gwang Park, Seung Ki Baek, and Min Young Kim. 2026. "Curvature-Adaptive Smoothing for Multi-View Industrial Metrology" Electronics 15, no. 11: 2360. https://doi.org/10.3390/electronics15112360
APA StyleLee, J. K., Kwon, S. W., Park, H. G., Baek, S. K., & Kim, M. Y. (2026). Curvature-Adaptive Smoothing for Multi-View Industrial Metrology. Electronics, 15(11), 2360. https://doi.org/10.3390/electronics15112360

