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Journal: Electronics, 2026
Volume: 15
Number: 150
Article:
Research on a Dual-Trust Selfish Node Detection Algorithm Based on Behavioral and Social Characteristics in VANETs
Authors:
by
Weihu Wang, Menglong Qin, Lan You, Chunmeng Yang, Qiangqiang Lou and Wenbo Guo
Link:
https://www.mdpi.com/2079-9292/15/1/150
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