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Journal: Electronics, 2026
Volume: 15
Number: 150

Article: Research on a Dual-Trust Selfish Node Detection Algorithm Based on Behavioral and Social Characteristics in VANETs
Authors: by Weihu Wang, Menglong Qin, Lan You, Chunmeng Yang, Qiangqiang Lou and Wenbo Guo
Link: https://www.mdpi.com/2079-9292/15/1/150

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