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Journal: Electronics, 2025
Volume: 14
Number: 1812

Article: How to Use Redundancy for Memory Reliability: Replace or Code?
Authors: by Hyosang Ju, Dong-Hyun Kong, Kijun Lee, Myung-Kyu Lee, Sunghye Cho and Sang-Hyo Kim
Link: https://www.mdpi.com/2079-9292/14/9/1812

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