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Journal: Electronics, 2025
Volume: 14
Number: 1794
1794
Article: Nonvolatile Applications and Reliability Investigation of La-Doped ZrO₂ Antiferroelectric Capacitors
Authors: by Jianguo Li, Junliang Zhou, Wenchao Yan, Zibo Dong, Yuetong Huo, ChoongHyun Lee, Zeping Weng and Yi Zhao
Link: https://www.mdpi.com/2079-9292/14/9/1794

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