Li, J.; Zhou, J.; Yan, W.; Dong, Z.; Huo, Y.; Lee, C.; Weng, Z.; Zhao, Y.
Nonvolatile Applications and Reliability Investigation of La-Doped ZrO2 Antiferroelectric Capacitors. Electronics 2025, 14, 1794.
https://doi.org/10.3390/electronics14091794
AMA Style
Li J, Zhou J, Yan W, Dong Z, Huo Y, Lee C, Weng Z, Zhao Y.
Nonvolatile Applications and Reliability Investigation of La-Doped ZrO2 Antiferroelectric Capacitors. Electronics. 2025; 14(9):1794.
https://doi.org/10.3390/electronics14091794
Chicago/Turabian Style
Li, Jianguo, Junliang Zhou, Wenchao Yan, Zibo Dong, Yuetong Huo, ChoongHyun Lee, Zeping Weng, and Yi Zhao.
2025. "Nonvolatile Applications and Reliability Investigation of La-Doped ZrO2 Antiferroelectric Capacitors" Electronics 14, no. 9: 1794.
https://doi.org/10.3390/electronics14091794
APA Style
Li, J., Zhou, J., Yan, W., Dong, Z., Huo, Y., Lee, C., Weng, Z., & Zhao, Y.
(2025). Nonvolatile Applications and Reliability Investigation of La-Doped ZrO2 Antiferroelectric Capacitors. Electronics, 14(9), 1794.
https://doi.org/10.3390/electronics14091794
