Teng, Y.; Li, D.; Xue, H.; Zhou, Y.; Wang, K.; Wu, Q.
Dynamic Multi-Fault Diagnosis-Based Root Cause Tracing for Assembly Production Lines of Liquid Storage Tanks. Electronics 2025, 14, 1546.
https://doi.org/10.3390/electronics14081546
AMA Style
Teng Y, Li D, Xue H, Zhou Y, Wang K, Wu Q.
Dynamic Multi-Fault Diagnosis-Based Root Cause Tracing for Assembly Production Lines of Liquid Storage Tanks. Electronics. 2025; 14(8):1546.
https://doi.org/10.3390/electronics14081546
Chicago/Turabian Style
Teng, You, Donghui Li, Hongkai Xue, Yunkai Zhou, Kefu Wang, and Qi Wu.
2025. "Dynamic Multi-Fault Diagnosis-Based Root Cause Tracing for Assembly Production Lines of Liquid Storage Tanks" Electronics 14, no. 8: 1546.
https://doi.org/10.3390/electronics14081546
APA Style
Teng, Y., Li, D., Xue, H., Zhou, Y., Wang, K., & Wu, Q.
(2025). Dynamic Multi-Fault Diagnosis-Based Root Cause Tracing for Assembly Production Lines of Liquid Storage Tanks. Electronics, 14(8), 1546.
https://doi.org/10.3390/electronics14081546