Wang, H.; Zhao, F.; An, X.; Zhao, Y.; Li, K.; Guo, Q.
TIANet: A Defect Classification Structure Based on the Combination of CNN and ViT. Electronics 2025, 14, 1502.
https://doi.org/10.3390/electronics14081502
AMA Style
Wang H, Zhao F, An X, Zhao Y, Li K, Guo Q.
TIANet: A Defect Classification Structure Based on the Combination of CNN and ViT. Electronics. 2025; 14(8):1502.
https://doi.org/10.3390/electronics14081502
Chicago/Turabian Style
Wang, Hongjuan, Fangzheng Zhao, Xinjun An, Youjun Zhao, Kunxi Li, and Quanbing Guo.
2025. "TIANet: A Defect Classification Structure Based on the Combination of CNN and ViT" Electronics 14, no. 8: 1502.
https://doi.org/10.3390/electronics14081502
APA Style
Wang, H., Zhao, F., An, X., Zhao, Y., Li, K., & Guo, Q.
(2025). TIANet: A Defect Classification Structure Based on the Combination of CNN and ViT. Electronics, 14(8), 1502.
https://doi.org/10.3390/electronics14081502