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Journal: Electronics, 2025
Volume: 14
Number: 570

Article: Investigation of a Physical Model for the Reverse Recovery Characteristics of PT-PIN FRD with a Buffer Layer
Authors: by Yameng Sun, Kun Ma, Xiong Yuan, Anning Chen, Xun Liu, Yifan Song, Xuehan Li, Tongtong Zi, Yang Zhou and Sheng Liu
Link: https://www.mdpi.com/2079-9292/14/3/570

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