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Journal: Electronics, 2025
Volume: 14
Number: 4740
4740
Article: An Ensemble Imbalanced Classification Framework via Dual-Perspective Overlapping Analysis with Multi-Resolution Metrics
Authors: by Yuan Li, Xinping Diao, Qiangwei Li, Zhihang Meng, Tianyang Chen, Yukun Lin, Yu Hao and Xin Gao
Link: https://www.mdpi.com/2079-9292/14/23/4740

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