Wang, Z.; Chen, G.; Sun, W.; Wu, X.; Zheng, L.; Zhang, Y.; Liu, Q.
An Efficient Detection Method for Wafer-Test-Induced Defects. Electronics 2025, 14, 4664.
https://doi.org/10.3390/electronics14234664
AMA Style
Wang Z, Chen G, Sun W, Wu X, Zheng L, Zhang Y, Liu Q.
An Efficient Detection Method for Wafer-Test-Induced Defects. Electronics. 2025; 14(23):4664.
https://doi.org/10.3390/electronics14234664
Chicago/Turabian Style
Wang, Zhenyu, Guangsheng Chen, Wen Sun, Xin Wu, Lingling Zheng, Yating Zhang, and Qiang Liu.
2025. "An Efficient Detection Method for Wafer-Test-Induced Defects" Electronics 14, no. 23: 4664.
https://doi.org/10.3390/electronics14234664
APA Style
Wang, Z., Chen, G., Sun, W., Wu, X., Zheng, L., Zhang, Y., & Liu, Q.
(2025). An Efficient Detection Method for Wafer-Test-Induced Defects. Electronics, 14(23), 4664.
https://doi.org/10.3390/electronics14234664