Bai, X.; Dong, Q.; Han, J.; Zhou, Y.; Qi, X.; Tian, L.
DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection. Electronics 2025, 14, 4570.
https://doi.org/10.3390/electronics14234570
AMA Style
Bai X, Dong Q, Han J, Zhou Y, Qi X, Tian L.
DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection. Electronics. 2025; 14(23):4570.
https://doi.org/10.3390/electronics14234570
Chicago/Turabian Style
Bai, Xinlong, Quancheng Dong, Jinshuo Han, Youjie Zhou, Xu Qi, and Longteng Tian.
2025. "DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection" Electronics 14, no. 23: 4570.
https://doi.org/10.3390/electronics14234570
APA Style
Bai, X., Dong, Q., Han, J., Zhou, Y., Qi, X., & Tian, L.
(2025). DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection. Electronics, 14(23), 4570.
https://doi.org/10.3390/electronics14234570