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Journal: Electronics, 2025
Volume: 14
Number: 4452
Article:
Capacitor Aging State Evaluation and a Remaining-Useful-Life Prediction Method Based on a CNN-LSTM Network Considering the Impact of Parameter Dispersion
Authors:
by
Yifan Jian, Zhi Chen, Shinian Peng, Liu Liu, Wei Zeng, Jia Liu and Qingyu Huang
Link:
https://www.mdpi.com/2079-9292/14/22/4452
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