Jian, Y.; Chen, Z.; Peng, S.; Liu, L.; Zeng, W.; Liu, J.; Huang, Q.
Capacitor Aging State Evaluation and a Remaining-Useful-Life Prediction Method Based on a CNN-LSTM Network Considering the Impact of Parameter Dispersion. Electronics 2025, 14, 4452.
https://doi.org/10.3390/electronics14224452
AMA Style
Jian Y, Chen Z, Peng S, Liu L, Zeng W, Liu J, Huang Q.
Capacitor Aging State Evaluation and a Remaining-Useful-Life Prediction Method Based on a CNN-LSTM Network Considering the Impact of Parameter Dispersion. Electronics. 2025; 14(22):4452.
https://doi.org/10.3390/electronics14224452
Chicago/Turabian Style
Jian, Yifan, Zhi Chen, Shinian Peng, Liu Liu, Wei Zeng, Jia Liu, and Qingyu Huang.
2025. "Capacitor Aging State Evaluation and a Remaining-Useful-Life Prediction Method Based on a CNN-LSTM Network Considering the Impact of Parameter Dispersion" Electronics 14, no. 22: 4452.
https://doi.org/10.3390/electronics14224452
APA Style
Jian, Y., Chen, Z., Peng, S., Liu, L., Zeng, W., Liu, J., & Huang, Q.
(2025). Capacitor Aging State Evaluation and a Remaining-Useful-Life Prediction Method Based on a CNN-LSTM Network Considering the Impact of Parameter Dispersion. Electronics, 14(22), 4452.
https://doi.org/10.3390/electronics14224452
