Nguyen, S.-Q.; Tran, P.T.; Minh, B.V.; Duy, T.T.; Le, A.-T.; Rejfek, L.; Tu, L.-T.
Statistical Analysis of the Sum of Double Random Variables for Security Applications in RIS-Assisted NOMA Networks with a Direct Link. Electronics 2025, 14, 392.
https://doi.org/10.3390/electronics14020392
AMA Style
Nguyen S-Q, Tran PT, Minh BV, Duy TT, Le A-T, Rejfek L, Tu L-T.
Statistical Analysis of the Sum of Double Random Variables for Security Applications in RIS-Assisted NOMA Networks with a Direct Link. Electronics. 2025; 14(2):392.
https://doi.org/10.3390/electronics14020392
Chicago/Turabian Style
Nguyen, Sang-Quang, Phuong T. Tran, Bui Vu Minh, Tran Trung Duy, Anh-Tu Le, Lubos Rejfek, and Lam-Thanh Tu.
2025. "Statistical Analysis of the Sum of Double Random Variables for Security Applications in RIS-Assisted NOMA Networks with a Direct Link" Electronics 14, no. 2: 392.
https://doi.org/10.3390/electronics14020392
APA Style
Nguyen, S.-Q., Tran, P. T., Minh, B. V., Duy, T. T., Le, A.-T., Rejfek, L., & Tu, L.-T.
(2025). Statistical Analysis of the Sum of Double Random Variables for Security Applications in RIS-Assisted NOMA Networks with a Direct Link. Electronics, 14(2), 392.
https://doi.org/10.3390/electronics14020392