Next Article in Journal
SATrack: Semantic-Aware Alignment Framework for Visual–Language Tracking
Previous Article in Journal
Recent Advances in Sliding Mode Control Techniques for Permanent Magnet Synchronous Motor Drives
 
 
Font Type:
Arial Georgia Verdana
Font Size:
Aa Aa Aa
Line Spacing:
Column Width:
Background:
This is an early access version, the complete PDF, HTML, and XML versions will be available soon.
Article

Optimization Algorithm for Detection of Impurities in Polypropylene Random Copolymer Raw Materials Based on YOLOv11

School of Intelligent Technology, Shanghai Institute of Technology, Shanghai 201418, China
*
Author to whom correspondence should be addressed.
Electronics 2025, 14(19), 3934; https://doi.org/10.3390/electronics14193934
Submission received: 8 September 2025 / Revised: 27 September 2025 / Accepted: 2 October 2025 / Published: 3 October 2025

Abstract

Impurities in polypropylene random copolymer (PPR) raw materials can seriously affect the performance of the final product, and efficient and accurate impurity detection is crucial to ensure high production quality. In order to solve the problems of high small-target miss rates, weak anti-interference ability, and difficulty in balancing accuracy and speed in existing detection methods used in complex industrial scenarios, this paper proposes an enhanced machine vision detection algorithm based on YOLOv11. Firstly, the FasterLDConv module dynamically adjusts the position of sampling points through linear deformable convolution (LDConv), which improves the feature extraction ability of small-scale targets on complex backgrounds while maintaining lightweight features. The IR-EMA attention mechanism is a novel approach that combines an efficient reverse residual architecture with multi-scale attention. This combination enables the model to jointly capture feature channel dependencies and spatial relationships, thereby enhancing its sensitivity to weak impurity features. Again, a DC-DyHead deformable dynamic detection head is constructed, and deformable convolutions are embedded into the spatial perceptual attention of DyHead to enhance its feature modelling ability for anomalies and occluded impurities. We introduce an enhanced InnerMPDIoU loss function to optimise the bounding box regression strategy. This new method addresses issues related to traditional CIoU losses, including excessive penalties imposed on small targets and a lack of sufficient gradient guidance in situations where there is almost no overlap. The results indicate that the average precision (mAP@0.5) of the improved algorithm on the self-made PPR impurity dataset reached 88.6%, which is 2.3% higher than that of the original YOLOv11n, while precision (P) and recall (R) increased by 2.4% and 2.8%, respectively. This study provides a reliable technical solution for the quality inspection of PPR raw materials and serves as a reference for algorithm optimisation in the field of industrial small-target detection.
Keywords: PPR raw materials; impurity detection; machine vision; YOLOv11; feature extraction; attention mechanism; object detection PPR raw materials; impurity detection; machine vision; YOLOv11; feature extraction; attention mechanism; object detection

Share and Cite

MDPI and ACS Style

Dai, M.; Jing, X. Optimization Algorithm for Detection of Impurities in Polypropylene Random Copolymer Raw Materials Based on YOLOv11. Electronics 2025, 14, 3934. https://doi.org/10.3390/electronics14193934

AMA Style

Dai M, Jing X. Optimization Algorithm for Detection of Impurities in Polypropylene Random Copolymer Raw Materials Based on YOLOv11. Electronics. 2025; 14(19):3934. https://doi.org/10.3390/electronics14193934

Chicago/Turabian Style

Dai, Mingchen, and Xuedong Jing. 2025. "Optimization Algorithm for Detection of Impurities in Polypropylene Random Copolymer Raw Materials Based on YOLOv11" Electronics 14, no. 19: 3934. https://doi.org/10.3390/electronics14193934

APA Style

Dai, M., & Jing, X. (2025). Optimization Algorithm for Detection of Impurities in Polypropylene Random Copolymer Raw Materials Based on YOLOv11. Electronics, 14(19), 3934. https://doi.org/10.3390/electronics14193934

Note that from the first issue of 2016, this journal uses article numbers instead of page numbers. See further details here.

Article Metrics

Back to TopTop