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Journal: Electronics, 2025
Volume: 14
Number: 3472
3472
Article: Development of an Extended-Band mTRL Calibration Kit for On-Wafer Characterization of InP-HEMTs up to 1.1 THz
Authors: by Rita Younes, Mahmoud Abou Daher, Mohammed Samnouni, Sylvie Lepilliet, Guillaume Ducournau, Nicolas Wichmann and Sylvain Bollaert
Link: https://www.mdpi.com/2079-9292/14/17/3472

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