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Journal: Electronics, 2025
Volume: 14
Number: 3455

Article: Unsupervised Structural Defect Classification via Real-Time and Noise-Robust Method in Smartphone Small Modules
Authors: by Sehun Lee, Taehoon Kim, Sookyun Kim, Junho Ahn and Namgi Kim
Link: https://www.mdpi.com/2079-9292/14/17/3455

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