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Journal: Electronics, 2025
Volume: 14
Number: 3260

Article: Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution
Authors: by Herman Koara, Hai Gong, Chao Xu, Shengze Cai and Xu Zhou
Link: https://www.mdpi.com/2079-9292/14/16/3260

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