Koara, H.; Gong, H.; Xu, C.; Cai, S.; Zhou, X.
Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution. Electronics 2025, 14, 3260.
https://doi.org/10.3390/electronics14163260
AMA Style
Koara H, Gong H, Xu C, Cai S, Zhou X.
Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution. Electronics. 2025; 14(16):3260.
https://doi.org/10.3390/electronics14163260
Chicago/Turabian Style
Koara, Herman, Hai Gong, Chao Xu, Shengze Cai, and Xu Zhou.
2025. "Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution" Electronics 14, no. 16: 3260.
https://doi.org/10.3390/electronics14163260
APA Style
Koara, H., Gong, H., Xu, C., Cai, S., & Zhou, X.
(2025). Region Segmentation for Efficient Semiconductor Inspection: A Deep Learning Approach with Transformers and Atrous Convolution. Electronics, 14(16), 3260.
https://doi.org/10.3390/electronics14163260