Yang, Z.; Xu, W.; Chen, N.; Chen, Y.; Wu, K.; Xie, M.; Xu, H.; Zheng, E.
SDA-YOLO: Multi-Scale Dynamic Branching and Attention Fusion for Self-Explosion Defect Detection in Insulators. Electronics 2025, 14, 3070.
https://doi.org/10.3390/electronics14153070
AMA Style
Yang Z, Xu W, Chen N, Chen Y, Wu K, Xie M, Xu H, Zheng E.
SDA-YOLO: Multi-Scale Dynamic Branching and Attention Fusion for Self-Explosion Defect Detection in Insulators. Electronics. 2025; 14(15):3070.
https://doi.org/10.3390/electronics14153070
Chicago/Turabian Style
Yang, Zhonghao, Wangping Xu, Nanxing Chen, Yifu Chen, Kaijun Wu, Min Xie, Hong Xu, and Enhui Zheng.
2025. "SDA-YOLO: Multi-Scale Dynamic Branching and Attention Fusion for Self-Explosion Defect Detection in Insulators" Electronics 14, no. 15: 3070.
https://doi.org/10.3390/electronics14153070
APA Style
Yang, Z., Xu, W., Chen, N., Chen, Y., Wu, K., Xie, M., Xu, H., & Zheng, E.
(2025). SDA-YOLO: Multi-Scale Dynamic Branching and Attention Fusion for Self-Explosion Defect Detection in Insulators. Electronics, 14(15), 3070.
https://doi.org/10.3390/electronics14153070
