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Journal: Electronics, 2025
Volume: 14
Number: 3056

Article: Research on the Evaluation Method of Electrical Stress Limit Capability Based on Reliability Enhancement Theory
Authors: by Shuai Zhou, Kaixue Ma, Zhihua Cai, Shoufu Liu, Jian Xiang and Chi Ma
Link: https://www.mdpi.com/2079-9292/14/15/3056

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