Zhou, S.; Ma, K.; Cai, Z.; Liu, S.; Xiang, J.; Ma, C.
Research on the Evaluation Method of Electrical Stress Limit Capability Based on Reliability Enhancement Theory. Electronics 2025, 14, 3056.
https://doi.org/10.3390/electronics14153056
AMA Style
Zhou S, Ma K, Cai Z, Liu S, Xiang J, Ma C.
Research on the Evaluation Method of Electrical Stress Limit Capability Based on Reliability Enhancement Theory. Electronics. 2025; 14(15):3056.
https://doi.org/10.3390/electronics14153056
Chicago/Turabian Style
Zhou, Shuai, Kaixue Ma, Zhihua Cai, Shoufu Liu, Jian Xiang, and Chi Ma.
2025. "Research on the Evaluation Method of Electrical Stress Limit Capability Based on Reliability Enhancement Theory" Electronics 14, no. 15: 3056.
https://doi.org/10.3390/electronics14153056
APA Style
Zhou, S., Ma, K., Cai, Z., Liu, S., Xiang, J., & Ma, C.
(2025). Research on the Evaluation Method of Electrical Stress Limit Capability Based on Reliability Enhancement Theory. Electronics, 14(15), 3056.
https://doi.org/10.3390/electronics14153056