Accurate Dual-Channel Broadband RF Attenuation Measurement System with High Attenuation Capability Using an Optical Fiber Assembly for Optimal Channel Isolation
Abstract
1. Introduction
2. Measurement System
3. Measurement Results and Uncertainty Evaluation
3.1. Optical Fiber Assembly Evaluation
3.1.1. Purity of the Output IF Signal Waveform
3.1.2. Frequency Response and Isolation
3.1.3. Amplitude and Phase Fluctuations
3.2. System Performance and Uncertainty Source Summary
- (1)
- Calibration of the IVD: The programmable IVD, Model 6430A, is used as the IF reference standard within the system. However, for calibration purposes, only manually operated IVDs are accepted as valid transfer standards by major national metrology institutes. To comply with this requirement, a manual-type IVD, Model 6415A, is prepared and pre-calibrated at 1 kHz with traceability to the Japan national standard for low-frequency voltage ratio. The 6430A is then calibrated by inserting the calibrated 6415A between the IF amplifier and the 6430A (see Figure 1). Table 1 presents the calibration results for nominal attenuation values of 20 dB, 40 dB, and 60 dB, along with the expanded uncertainties US (coverage factor k = 2), where the standard uncertainties and their components are estimated based on the contributions listed in Table 2. To verify the validity of these calibrations, the results and their associated uncertainties were compared with the calibration values and expanded uncertainties of the 6415A (UT) as specified in its calibration certificate, using the En-value method [19]. All calculated En values were found to be less than 1.0, indicating good agreement with the reference values from the 6415A calibration.
- (2)
- Nonlinearity: From Figure 6, the nonlinearity limits are determined to be 6.0 × 10−4 dB for measurements up to 40 dB (−30 to −70 dBm), and 1.5 × 10−3 dB for measurements up to 60 dB (−20 to −80 dBm). For measurement ranges exceeding 60 dB, a double-step technique is employed, allowing mixer input levels of 0 dBm or higher to be applied without inducing saturation effects. As a result, the nonlinearity limits are 1.5 × 10−3 dB for measurements up to 80 dB (0 to −80 dBm), and 3.5 × 10−3 dB for measurements up to 100 dB (0 to −100 dBm). The corresponding standard uncertainties u(X2) are calculated by assuming a rectangular probability distribution using a divisor of .
- (3)
- Amplitude Fluctuation of the Optical Fiber Assembly: As described in Section 3.1.3, the observed signal fluctuations are less than 9.0 × 10−4 dB. Assuming a rectangular distribution, the corresponding standard uncertainty u(X3) is calculated to be 2.6 × 10−4 dB.
- (4)
- Phase Fluctuation of the Optical Fiber Assembly: As described in Section 3.1.3, the effect of phase fluctuations on signal stability is estimated to be 3.3 × 10−4 dB. Assuming a U-shaped distribution using a divisor of , the resulting standard uncertainty u(X4) is estimated as 2.3 × 10−4 dB.
- (5)
- Leakage: Uncertainty due to leakage arises from signals that bypass the DUT or the reference standard, as well as from signals traveling along unintended paths. Both RF/microwave and IF leakage effects exist in the system; however, the IF leakage is rendered negligibly small through the use of shielded cables, shielded cases, and single-point grounding, which effectively suppress earth loop currents. The dominant contribution comes from RF/microwave leakage, which can be further categorized into internal and external leakage components.Internal Leakage: The internal leakage shown by Figure 1 depends on the isolation of main and reference mixers and the directivity of the coupler besides the isolation of the optical assembly. The mixers isolation and the directivity of the coupler are assumed to be greater than 20 dB. Then, the system isolation is estimated to be higher than 180 dB, i.e., 20 dB (coupler) + 20 dB (reference mixer) + 120 dB (optical fiber assembly) + 20 dB (main mixer), which means that the internal leakage is 80 dB lower than the measurement signal for an attenuation measurement of 100 dB. Then, by (2), the uncertainty limits ΔAL due to the internal leakage can be estimated to be ±8.7 × 10−4 dB.External leakage: The external leakage path refers to a route through which signals are emitted from the system, propagate externally, re-enter the system, bypassing the DUT, and reach the main mixer. Unlike internal leakage, the attenuation of external leakage paths is difficult to estimate, as it depends on uncontrolled propagation conditions. The leakage effects in the RF circuit are influenced by the relative phase between the measurement signal and the leakage signal at the input of the main mixer. Therefore, these effects can be detected by comparing measurement values under different phase conditions. These conditions were introduced by inserting quarter- and half-wavelength extensions between the DUT and the main mixer. At a signal level of −100 dBm, the differences between measured values were not clearly distinguishable due to a measurement dispersion of approximately 4.0 × 10−3 dB. However, a nonlinearity of −1.5 × 10−3 dB was observed at this level (Figure 6). Based on these results, the upper bound of the leakage effect at −100 dBm is estimated to be ±0.0015 dB.
- (6)
- Gauge block attenuator: The single-step (normal) measurement technique is used for attenuation measurements up to 60 dB. For measurements exceeding 60 dB, a double-step technique is employed, in which a gauge block attenuator (e.g., 40-dB) is switched into and out of the circuit. This approach helps to maintain low noise influence during high-attenuation measurements. The standard uncertainty, u(X6), associated with the gauge block was determined through measurements performed using the single-step technique within this system.
- (7)
- Mismatch: For variable attenuator measurements, the mismatch uncertainty is minimized by tuning the reflection coefficients at both test ports to be less than 0.01. The residual mismatch uncertainty, u(X7), is then calculated using expression (38) provided in [20]. For fixed attenuator measurements, the mismatch correction is applied. Subsequently, the mismatch uncertainty is calculated using expression (5) provided in [2].
4. Conclusions
Funding
Data Availability Statement
Conflicts of Interest
Abbreviations
AMP | Amplifier |
CCEM | Consultative Committee for Electricity and Magnetism |
CPL | Coupler |
DMM | Digital Multimeter |
DUT | Devices Under Test |
EOM | External Optical Modulator |
GPIB | General Purpose Interface Bus |
HQ FLEX COAX | High Quality Coaxial Cable |
IF | Intermediate Frequency |
IF-AMP | Intermediate Frequency Amplifier |
ISOL | Isolator |
ISOL- XMFR | Isolation Transformer |
IVD | Inductive Voltage Divider |
LD | Laser Diode |
LED | Light Emitting Diode |
LiA | Lock-in Amplifier |
LO | Local |
LPF | Low-Pass Filter |
MIMO | Multi-Input and Multi-Output |
OFC | Optical Fiber Cable |
PD | Photo Detector |
PS | Phase Shifter |
PWD | Power Divider |
PWR LVLR | Power Leveler |
PWR PAD | Power Pad |
REF | Reference |
RF | Radio Frequency |
SAT AMP | Saturation Amplifier |
VNA | Vector Network Analyzer |
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Model 6415A | Model 6430A | En Value | |||||
---|---|---|---|---|---|---|---|
Dial Setting | Nominal | Cal. Value | UT (k = 2) | Meas. Result | Us (k = 2) | ||
Initial | Final | [dB] | [dB] | [dB] | [dB] | [dB] | [dB] |
1 | 0.1 | 20 | 20.0000 | 1.7 × 10−5 | 19.9996 | 4.8 × 10−4 | 0.78 |
1 | 0.01 | 40 | 40.0000 | 1.7 × 10−4 | 39.9995 | 5.6 × 10−4 | 0.93 |
1 | 0.001 | 60 | 60.0001 | 1.7 × 10−3 | 59.9994 | 1.8 × 10−3 | 0.27 |
Model 6430A | ||||
---|---|---|---|---|
Nominal | u(X11) | u(X12) | u(X11) | u(X1) |
[dB] | [dB] | [dB] | [dB] | [dB] |
20 | 8.7 × 10−6 | 2.0 × 10−4 | 1.3 × 10−4 | 2.4 × 10−4 |
40 | 8.7 × 10−5 | 2.0 × 10−4 | 1.8 × 10−4 | 2.8 × 10−4 |
60 | 8.7 × 10−4 | 2.0 × 10−4 | 1.9 × 10−4 | 9.1 × 10−4 |
Source of Uncertainty | Category | Probability Distribution | Nominal Attenuation [dB] | |||||
---|---|---|---|---|---|---|---|---|
20 | 40 | 60 | 80 | 100 | ||||
Standard Uncertainty [dB] | ||||||||
u(Xi) | u(Xi) | u(Xi) | u(Xi) | u(Xi) | ||||
1 | Calibration of the IVD | B | Normal | 2.4 × 10−4 | 2.8 × 10−4 | 9.1 × 10−4 | 2.8 × 10−4 | 9.1 × 10−4 |
2 | Nonlinearity | B | Rectagular | 2.3 × 10−4 | 3.5 × 10−4 | 8.7 × 10−4 | 8.7 × 10−4 | 2.0 × 10−3 |
3 | Amplitude Fluctuation of the Optical Fiber Assembly | B | Rectagular | 2.9 × 10−4 | 2.9 × 10−4 | 2.9 × 10−4 | 2.9 × 10−4 | 2.9 × 10−4 |
4 | Phase Fluctuation of the Optical Fiber Assembly | B | U | 2.3 × 10−4 | 2.3 × 10−4 | 2.3 × 10−4 | 2.3 × 10−4 | 2.3 × 10−4 |
5 | Leakage | |||||||
5-1 | Internal Leakage | B | U | 3.8 × 10−7 | 2.4 × 10−6 | 1.5 × 10−5 | 9.7 × 10−5 | 6.2 × 10−4 |
5-2 | External Leakage: | B | U | 6.6 × 10−7 | 4.2 × 10−6 | 2.7 × 10−5 | 1.7 × 10−4 | 1.1 × 10−3 |
6 | Gauge Block Attenuator | B | Normal | 2.4 × 10−3 | 2.4 × 10−3 | |||
7 | Mismatch | B | U | 1.9 × 10−3 | 2.3 × 10−3 | 3.7 × 10−3 | 3.7 × 10−3 | 3.7 × 10−3 |
8 | SDOM | A | Normal | 2.0 × 10−4 | 3.0 × 10−4 | 6.0 × 10−4 | 7.0 × 10−4 | 7.0 × 10−4 |
(u) Combined Standard Uncertainty | 2.0 × 10−3 | 2.4 × 10−3 | 4.0 × 10−3 | 4.6 × 10−3 | 5.1 × 10−3 | |||
(U) Expanded Uncertainty | k = 2 | 4.0 × 10−3 | 4.8 × 10−3 | 8.0 × 10−3 | 9.2 × 10−3 | 1.0 × 10−2 |
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Widarta, A. Accurate Dual-Channel Broadband RF Attenuation Measurement System with High Attenuation Capability Using an Optical Fiber Assembly for Optimal Channel Isolation. Electronics 2025, 14, 2963. https://doi.org/10.3390/electronics14152963
Widarta A. Accurate Dual-Channel Broadband RF Attenuation Measurement System with High Attenuation Capability Using an Optical Fiber Assembly for Optimal Channel Isolation. Electronics. 2025; 14(15):2963. https://doi.org/10.3390/electronics14152963
Chicago/Turabian StyleWidarta, Anton. 2025. "Accurate Dual-Channel Broadband RF Attenuation Measurement System with High Attenuation Capability Using an Optical Fiber Assembly for Optimal Channel Isolation" Electronics 14, no. 15: 2963. https://doi.org/10.3390/electronics14152963
APA StyleWidarta, A. (2025). Accurate Dual-Channel Broadband RF Attenuation Measurement System with High Attenuation Capability Using an Optical Fiber Assembly for Optimal Channel Isolation. Electronics, 14(15), 2963. https://doi.org/10.3390/electronics14152963