Hu, A.; Feng, W.; Zhu, X.; Wang, J.; Ao, Y.; Feng, H.
MetaGAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles. Electronics 2025, 14, 2596.
https://doi.org/10.3390/electronics14132596
AMA Style
Hu A, Feng W, Zhu X, Wang J, Ao Y, Feng H.
MetaGAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles. Electronics. 2025; 14(13):2596.
https://doi.org/10.3390/electronics14132596
Chicago/Turabian Style
Hu, Anlin, Wenjiang Feng, Xudong Zhu, Junjie Wang, Yiping Ao, and Hao Feng.
2025. "MetaGAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles" Electronics 14, no. 13: 2596.
https://doi.org/10.3390/electronics14132596
APA Style
Hu, A., Feng, W., Zhu, X., Wang, J., Ao, Y., & Feng, H.
(2025). MetaGAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles. Electronics, 14(13), 2596.
https://doi.org/10.3390/electronics14132596