Next Article in Journal
Total Ionizing Dose Effects on Lifetime of NMOSFETs Due to Hot Carrier-Induced Stress
Previous Article in Journal
Explainable AI Models for IoT-Based Shaft Power Prediction and Comprehensive Performance Monitoring
 
 
Article

Article Versions Notes

Electronics 2025, 14(13), 2562; https://doi.org/10.3390/electronics14132562
Action Date Notes Link
article xml file uploaded 24 June 2025 17:04 CEST Original file -
article xml uploaded. 24 June 2025 17:04 CEST Update https://www.mdpi.com/2079-9292/14/13/2562/xml
article pdf uploaded. 24 June 2025 17:04 CEST Version of Record https://www.mdpi.com/2079-9292/14/13/2562/pdf
article html file updated 24 June 2025 17:06 CEST Original file -
article html file updated 25 June 2025 11:15 CEST Update https://www.mdpi.com/2079-9292/14/13/2562/html
Back to TopTop