Chen, Z.; Tian, R.; Xiong, D.; Yuan, C.; Li, T.; Shi, Y.
Multi-Dimensional Information Fusion You Only Look Once Network for Suspicious Object Detection in Millimeter Wave Images. Electronics 2024, 13, 773.
https://doi.org/10.3390/electronics13040773
AMA Style
Chen Z, Tian R, Xiong D, Yuan C, Li T, Shi Y.
Multi-Dimensional Information Fusion You Only Look Once Network for Suspicious Object Detection in Millimeter Wave Images. Electronics. 2024; 13(4):773.
https://doi.org/10.3390/electronics13040773
Chicago/Turabian Style
Chen, Zhenhong, Ruijiao Tian, Di Xiong, Chenchen Yuan, Tang Li, and Yiran Shi.
2024. "Multi-Dimensional Information Fusion You Only Look Once Network for Suspicious Object Detection in Millimeter Wave Images" Electronics 13, no. 4: 773.
https://doi.org/10.3390/electronics13040773
APA Style
Chen, Z., Tian, R., Xiong, D., Yuan, C., Li, T., & Shi, Y.
(2024). Multi-Dimensional Information Fusion You Only Look Once Network for Suspicious Object Detection in Millimeter Wave Images. Electronics, 13(4), 773.
https://doi.org/10.3390/electronics13040773