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Journal: Electronics, 2024
Volume: 13
Number: 4824

Article: Optimized AI Methods for Rapid Crack Detection in Microscopy Images
Authors: by Chenxukun Lou, Lawrence Tinsley, Fabian Duarte Martinez, Simon Gray and Barmak Honarvar Shakibaei Asli
Link: https://www.mdpi.com/2079-9292/13/23/4824

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