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Journal: Electronics, 2024
Volume: 13
Number: 4724

Article: Reliability Evaluation of LED Lamp Beads Considering Multi-Stage Wiener Degradation Process Under Generalized Coupled Accelerated Stress
Authors: by Yinglong Dong, Zhen Zhou, He Dai and Kaixin Liu
Link: https://www.mdpi.com/2079-9292/13/23/4724

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