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Journal: ElectronicsVolume: 13Number: 4724
Article: Reliability Evaluation of LED Lamp Beads Considering Multi-Stage Wiener Degradation Process Under Generalized Coupled Accelerated Stress
  • Authors:
  • Yinglong Dong1,
  • Zhen Zhou1,* and
  • He Dai2
  • et al.
Link: https://www.mdpi.com/2079-9292/13/23/4724

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