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Journal: Electronics, 2024
Volume: 13
Number: 3664

Article: Research on Gate Charge Degradation of Multi-Chip IGBT Modules in Power Supply for Unmanned Aerial Vehicles
Authors: by Yuheng Li, Zhiquan Zhou, Jinlong Wang, Lina Wang and Chenxu Wang
Link: https://www.mdpi.com/2079-9292/13/18/3664

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