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Journal: Electronics, 2024
Volume: 13
Number: 3664
Article:
Research on Gate Charge Degradation of Multi-Chip IGBT Modules in Power Supply for Unmanned Aerial Vehicles
Authors:
by
Yuheng Li, Zhiquan Zhou, Jinlong Wang, Lina Wang and Chenxu Wang
Link:
https://www.mdpi.com/2079-9292/13/18/3664
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