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Journal: Electronics, 2024
Volume: 13
Number: 2945

Article: Investigation of Defect Formation in Monolithic Integrated GaP Islands on Si Nanotip Wafers
Authors: by Ines Häusler, Rostislav Řepa, Adnan Hammud, Oliver Skibitzki and Fariba Hatami
Link: https://www.mdpi.com/2079-9292/13/15/2945

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