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Journal: Electronics, 2024
Volume: 13
Number: 2937

Article: Design Optimization of an Enhanced-Mode GaN HEMT with Hybrid Back Barrier and Breakdown Voltage Prediction Based on Neural Networks
Authors: by Kuiyuan Tian, Jinwei Hu, Jiangfeng Du and Qi Yu
Link: https://www.mdpi.com/2079-9292/13/15/2937

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