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Journal: Electronics, 2024
Volume: 13
Number: 2771
Article:
CFE-YOLOv8s: Improved YOLOv8s for Steel Surface Defect Detection
Authors:
by
Shuxin Yang, Yang Xie, Jianqing Wu, Weidong Huang, Hongsheng Yan, Jingyong Wang, Bi Wang, Xiangchun Yu, Qiang Wu and Fei Xie
Link:
https://www.mdpi.com/2079-9292/13/14/2771
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