Zhang, J.; Luo, H.; Wu, H.; Zheng, B.; Chen, X.; Zhang, G.; French, P.; Wang, S.
RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics 2024, 13, 2347.
https://doi.org/10.3390/electronics13122347
AMA Style
Zhang J, Luo H, Wu H, Zheng B, Chen X, Zhang G, French P, Wang S.
RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics. 2024; 13(12):2347.
https://doi.org/10.3390/electronics13122347
Chicago/Turabian Style
Zhang, Jingping, Houcai Luo, Huan Wu, Bofeng Zheng, Xianping Chen, Guoqi Zhang, Paddy French, and Shaogang Wang.
2024. "RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study" Electronics 13, no. 12: 2347.
https://doi.org/10.3390/electronics13122347
APA Style
Zhang, J., Luo, H., Wu, H., Zheng, B., Chen, X., Zhang, G., French, P., & Wang, S.
(2024). RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics, 13(12), 2347.
https://doi.org/10.3390/electronics13122347