Next Article in Journal
Research on a Unified Data Model for Power Grids and Communication Networks Based on Graph Databases
Previous Article in Journal
Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP
 
 
Due to scheduled maintenance work on our database systems, there may be short service disruptions on this website between 10:00 and 11:00 CEST on June 14th.
Article

Article Versions Notes

Electronics 2024, 13(11), 2013; https://doi.org/10.3390/electronics13112013
Action Date Notes Link
article xml file uploaded 22 May 2024 06:24 CEST Original file -
article xml uploaded. 22 May 2024 06:24 CEST Update https://www.mdpi.com/2079-9292/13/11/2013/xml
article pdf uploaded. 22 May 2024 06:24 CEST Version of Record https://www.mdpi.com/2079-9292/13/11/2013/pdf
article html file updated 22 May 2024 06:26 CEST Original file https://www.mdpi.com/2079-9292/13/11/2013/html
Back to TopTop