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Journal: Electronics, 2024
Volume: 13
Number: 64

Article: Evaluation of Single Event Upset on a Relay Protection Device
Authors: by Hualiang Zhou, Hao Yu, Zhiyang Zou, Zhantao Su, Qianyun Zhao, Weitao Yang and Chaohui He
Link: https://www.mdpi.com/2079-9292/13/1/64

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