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Journal: Electronics, 2024
Volume: 13
Number: 182

Article: Predicting Software Defects in Hybrid MPI and OpenMP Parallel Programs Using Machine Learning
Authors: by Amani S. Althiban, Hajar M. Alharbi, Lama A. Al Khuzayem and Fathy Elbouraey Eassa
Link: https://www.mdpi.com/2079-9292/13/1/182

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